Reliability and interpretation of the microstructural parameters determined by X-ray line profile analysis for nanostructured materials

Abstract In this overview, the applicability of X-ray diffraction line profile analysis (XLPA) for characterization microstructure in nanostructured materials is overviewed. The dislocation densities obtained by whole pattern fitting and from breadth peaks are compared. Both theoretical considerations experimental evidences prove that evaluation peak solely not suitable determination density. addition, microstructural parameters determined XLPA were compared to values directly microscopic methods. It was found ratio grain size microscopy crystallite decreases with reduction nanomaterials, below $$\sim $$ ∼ 20 nm, two agree within error. correlation between (e.g., density) found. revealed bottom–up processing methods can produce similarly high defect density as severe plastic deformation (SPD). influence stacking fault energy, melting point, degree alloying on nanomaterials discussed detail.